Swiss innovation center CSEM, in collaboration with Dutch deep-tech startup QDI Systems, has developed the world’s first image sensor to directly convert X-rays into electronic signals using quantum dots (QDs) on a CMOS platform. This revolutionary approach enables compact, low-cost, and scalable wide-spectrum imaging – from X-rays through SWIR. The sensor leverages a spray-coated layer of quantum dots, nanoscale semiconductor crystals tuned to absorb different wavelengths, deposited directly onto standard CMOS chips.
