Optische Messtechnik
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Compact Time-of-Flight Sensors
With the OT200, Baumer has developed one of the most compact time-of-flight sensors, featuring a small blind spot (
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High-Precision Inline Measurement of Thin Films
The white-light interferometers of the IMS5200-TH series from Micro-Epsilon are used for nanometer-precise film thickness measurements from 1 to 100µm with a linearity of
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Automatic measurement of form, position, roughness, and twist
Hommel Etamic presents the Formline F900, which performs various measuring tasks fully automatically: the measurement of form, runout, and position tolerances; the determination of specific characteristics such as taper, crown, or dominant roundness waviness; and optionally roughness, waviness, and twist measurements.
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Image: Hans Turck GmbH & Co. KG
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